
Dr. Priyadarshi Mukherjee, Department of Electrical Engineering and Computer Science, IISER Bhopal in collaboration with the research groups of Prof. Hirley Alves (University of Oulu, Finland), Prof. Ioannis Krikidis (University of Cyprus, Cyprus), and Prof. Kai Kit Wong (University College London, UK) presented a comprehensive dependability-based analysis of FAS tailored to mission-critical IIoT applications. By deriving closed-form LCR and AFD expressions for an N-port FAS under Nakagami-m fading, the authors revised mission reliability and MTTFF. Moreover, they extended the EC into the FBL regime, which allows us to define mEC that inherently guarantees failure-free operation over a specified duration. Incorporating realistic traffic models and a refined power-consumption model, the authors formulated the mEEE metric and developed an efficient modified Dinkelbach algorithm for its maximization. Numerical results illustrate the fundamental trade-offs between reliability, latency, and energy efficiency, demonstrating that increased port diversity and careful SNR optimization are critical for sustaining high mEEE under stringent URLLC requirements. For more details, kindly visit https://ieeexplore.ieee.org/document/11616681